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FormFactor HPD Cryostats Enable Frontier Astrophysical Research
FormFactor engineers recently had the thrill of designing and building two prototype HPD cryostats for the Submillimeter Array on Maunakea in Hawaii.The SMA is a collaborative project with the Smithsonian Astrophysical Observatory(SAO)and Academia Sinica Institute of Astronomy and Astrophysics.
2025-01-21
WINCAL射频校准软件与网分连接时，由于客户的测试计算机、网分的版本等不同，底层的运行库、环境文件等都不一致，在WINCAL软件激活、和网分连接时经常会出现各种不可预知的问题。
2025-01-21
本文深入浅出地阐明pA、fA级电流测量的挑战、Triaxial三轴电缆、Guard技术原理、源测量单元SMU是什么、常规的电流表、电压表的特征、电缆漏电、FormFactor两款探针技术指标说明。通过本文的阅读与理解，可以系统性地对fA级测量有系统理解，具对直流低噪声探针台的Micro-Chamber、Atto-Guard技术、低噪声直流探针、以及SUM测量单元都有一个全面认识。
2025-01-21
半导体晶圆射频测量表征时需要用到射频探针，因此使用前必须校准。当然即便是测试对象是电路模块或者系统，也必须要进行校准的。测试工程师对测量前需要校准这一事件是清楚的，也知道是必要的。但是一般工程师很少关于校准的内涵，包括为何需要校准，校准那些误差项，采取什么算法实施校准合适、校准时为何需要修正等问题相对来说可能比较含糊，本系列文章主要针对这些问题进行作答。为了便于读者的阅读和理解，作者以笔记的方式来进行书写。因为虽然测试工程师可以找到一些关于校准的论文，但是读起来都是一头雾水，反馈说很吃力，看不懂。一方面除了公式推导外，还有一个主要的原因是公式推导前引用的信号流图或者其他逻辑图都十分直接，没有来龙去脉，这样导致读者对知识点串联不起来，因此理解的不清楚。
2025-01-21
如何求解网络分析仪12项误差是要依据流程图来完成的，求解方法是通过梅森流程图来实现。12项误差模型是网路分析仪误差中最为经典的模型了，只有深刻理解了12项误差的求解过程，后续才深入理解10项误差模型、8项误差模型项等延伸的校准算法。
2025-01-21
Scanning SQUID Microscope – Accelerating Quantum Computing Development
We just launched our first product for the emerging quantum computing market–the HPD IQ1000–a scanning SQUID microscope,or Superconducting Quantum Interference Device.It is used to study the dynamics of trapped magnetic flux(magnetic vortices)in superconducting circuits.
2025-01-15
New Integrated Measurement Systems from FormFactor and Keysight Technologies
FormFactor and Keysight Technologies now offer a new family of application-specific Integrated Measurement Systems(IMS),sold exclusively by FormFactor.This partnership of industry leaders delivers unmatched capabilities to meet today’s on-wafer test and measurement challenges.
2025-01-15
New Integrated Measurement Systems from FormFactor and Keysight Technologies
FormFactor and Keysight Technologies now offer a new family of application-specific Integrated Measurement Systems(IMS),sold exclusively by FormFactor.This partnership of industry leaders delivers unmatched capabilities to meet today’s on-wafer test and measurement challenges.
2025-01-15
Delivering Advanced mm-Wave Load-Pull Measurements
The ramp-up of 5G mm-Wave technologies comes with substantial enhancements in connectivity,revolutionizing smart cities,the internet of things,vehicle to everything(V2X),and more.
2025-01-15
Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations
Our ReAlign™technology,previously an exclusive feature on the CM300xi probe station,is now available for the SUMMIT200.ReAlign sets the standard for automated probe-to-pad alignment for those applications that have limited microscope view,such as vertical and Pyramid probe cards.It delivers autonomous semiconductor test at multiple temperatures.
2025-01-15